Text:
MCD18-001_pr_vts_2030-eng.pdf
Pictures (Print, CMYK):
Please feel free to order high resolution images via e-mail.
Pictures (Web, RGB):
2018-01_vts2030-1-web_mcd.jpg
2018-01_vts2030-2-web_mcd.jpg
2018-01_vts2030-3-web_mcd.jpg
2018-01_vts2030-4-web_mcd.jpg
Project site:
VTS 2030 - Standard Test Systems
The new test system series of MCD Elektronik
Birkenfeld, Germany, March 12, 2018: The measurement and testing specialist MCD Elektronik has officially released its modular and versatile test system series „VTS 2030“ at the productronica 2017 in Munich. Product Manager Rüdiger Fritze: „The prominent feature of the VTS 2030 is the possibility to modify it for various assemblies and products within very short change-over times. With this new development, we responded to the customers´ growing demand for high-end testing facilities, who rather manufacture small quantities of quickly changing variants and really hit the bullseye.“
The MCD VTS Rack is the basis of every system, including a PC and the „MCD Universal Measurement System UMS 1300 ULC“. The ULC Multifunctioncal Card offers multiple possibilities for data analysis as well as the generation of signals. On top the system has up to 8 slots for relay multiplexer cards. The test adapter with the assembly nest to be tested is located on the table´s surface. The complete test adapter is connected to the VTS through a pylon interface.
The „MCD Modular Measurement System 2030“ is also located inside of the test adapter. Connected through a bus it offers a maximum of four module holders for up to 16 functional modules for the individual creation of the test environment. Users have the choice between DigitalOut, AnalogIn, Analog and Digital-Mux-modules, expandable with Multimeter, PWM, CAN/LIN or audio modules. In addition to that two I2C-Bus Master, two counter inputs and two connections on the codec for synchronous audio connections are configurable. Through the easy change of functional modules the test adapter is adjusted for special testing demands. With over 8.000 active licenses the proven „MCD TestManager“ is also available for the control, evaluation and documentation of the test performance in the VTS 2030. Moreover, MCD offers a solution for the customers who prefer to work in a LabView test environment.
MCD cooperates, amongst others, with the test adapter specialist Ingun who configures the pylon adapter with interface blocks for electrical signals, light conductors and pneumatic. Special blocks for applications like high current, high frequency, etc. are additionally available. With only minimal adjustments, the system can be utilized for functional, End-of-Line, manual functional as well as Boundary Scan tests. „Some customers also use it as a repair system, control of packaging or as an assembly and test station“, Fritze adds.
MCD manufactures the nest of the DUT according to customers´demands. For flat modules mostly needle beds are used but „easy to handle“ adaptions are also produced for electro-mechanical assemblies. Additional test adapters can be reordered for the test of various products according to its pylon interface. MCD delivers the adapter via postal service and the system remains at the customers´ site.
The test bench can be moved electrically to an ergonomically accepted work height and therefore can be customized according to the personnels´ individual needs. The workers sign in to the system via RFID device (card, wrist band or chip). This enables a flexible user and authorization management system. The visualization of the test results via an integrated signal lamp is useful: green for OK-parts, red for defective parts (NOK).
__________________________________________________________________
MCD Elektronik GmbH
Hoheneichstr. 52 | 75217 Birkenfeld | Tel. +49 7231 78 405-49 | Fax +49 7231 78 405-10
Ms. Verena Feidy, verena.feidymcd-elektronik.SPAMPROTECTION.de
